Challenge
Detecting sub-microscopic defects e.g. in advanced semiconductor components often leads to production delays or compromised quality. Traditional methods struggle with identifying these defects efficiently.
Solution
Raynetics’ AI-powered 3D imaging provides precise visualizations of nanostructures, enabling early detection of surface and subsurface defects. This accelerates quality control processes and reduces costly production downtime.
Minimized production delays
Improved product reliability